A Low Capture Power Test Generation Method Using Capture Safe Test Vectors

被引：0

作者：

Hirai, Atsushi ^{[1
]}

Hosokawa, Toshinori ^{[2
]}

Yamauchi, Yukari ^{[2
]}

Arai, Masayuki ^{[2
]}

机构：

[1] Nihon Univ, Grad Sch Ind Technol, Chiba, Japan

[2] Nihon Univ, Coll Ind Technol, Chiba, Japan

来源：

2015 20th IEEE European Test Symposium (ETS) | 2015年

关键词：

low power; test generation; capture-safe test vectors; test vector synthesis; unsafe faults;

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper, we propose a new low capture power test generation method based on fault simulation to reduce the number of unsafe faults. The method uses capture-safe test vectors in an initial test set to generate new test vectors. Our experimental results show that the use of this method reduces the number of unsafe faults by 94% on average, and while requiring less test generation time compared with the conventional low capture power test generation method.

引用

页数：2

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