A High-speed Wireless Data Transfer for Non Destructive Testing

被引:0
|
作者
Dangba, Hanh [1 ]
Bui-ngoc, Thang [1 ]
Kim, Hae-jin [1 ]
Song, Jun-hee [1 ]
Chung, Chaiyoon [1 ]
Byun, Gyung-Su [1 ]
机构
[1] Inha Univ, Sch Informat & Commun Engn, Incheon 22212, South Korea
关键词
Wireless data transfer; WDT; wafer-level testing;
D O I
10.1109/ISOCC53507.2021.9613878
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This paper presents a sub-THz wireless data transfer (WDT) design for low-power chip-to-chip communication using on-off keying (OOK) modulation scheme. Input baseband data is modulated with a 90-GHz clock signal, which is generated by the proposed near-threshold voltage-controlled oscillator. The modulated signal is transferred through an air media by using the proposed inductive coupler. Since the sub-THz frequency band is utilized, a data rate of 10 Gb/s could be achieved while the chip size is only 0.2 mm(2) and 0.3 mm(2) for transmitter and receiver, respectively. The proposed WDT design consumes only 15 mW power from a 1-V supply.
引用
收藏
页码:315 / 316
页数:2
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