Depth-dependence of the bulk etch rate of gamma-ray irradiated CR-39 track detector

被引：18
|
作者：
Yamauchi, T [1 ]
Ichijo, H [1 ]
Oda, K [1 ]
机构：
[1] Kobe Univ Mercantile Marine, Dept Nucl Engn, Higashinada Ku, Kobe, Hyogo 6580022, Japan
来源：
RADIATION MEASUREMENTS | 2001年 / 34卷 / 1-6期
关键词：
CR-39; gamma-ray dosimeter; dose effect; dose-rate effect; oxygen effect;
D O I：
10.1016/S1350-4487(01)00126-3
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
The depth-dependent bulk etch rate has been examined for the gamma-irradiated CR-39 at doses ranging from 20 to 100 kGy. The thickness of the damaged region in gamma-irradiated CR-39 plastics, in which the bulk etch rate was significantly enhanced, was found to be limited in the thin layer near the surface and decreases with increasing the dose-rate, while it barely depend on the total dose. This indicates that it is possible to apply CR-39 plastics as high dose gamma-dosimeter by assessing both the bulk etch rate in the damaged region and its thickness in principle. (C) 2001 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码：85 / 89
页数：5
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