Minority carrier lifetimes in digitally-grown, narrow-gap, AlInAsSb alloys

被引:1
|
作者
Muhowski, A. J. [1 ]
March, S. D. [1 ]
Maddox, S. J. [1 ]
Wasserman, D. [1 ]
Bank, S. R. [1 ]
机构
[1] Univ Texas Austin, Elect & Comp Engn Dept, Austin, TX 78758 USA
关键词
INASSB; NOISE;
D O I
10.1063/5.0074304
中图分类号
O59 [应用物理学];
学科分类号
摘要
The minority carrier lifetime in extended-short-wavelength infrared and mid-wavelength infrared digitally-grown AlInAsSb alloys has been measured by time-resolved photoluminescence, ranging from 26 to 260ns depending on temperature and composition. The temperature dependence of the minority carrier lifetime and the power-dependence of continuous-wave photoluminescence indicate the presence of at least two deleterious Shockley-Read-Hall recombination centers, limiting the minority carrier lifetime of AlInAsSb alloys, particularly with non-zero Al concentration. Published under an exclusive license by AIP Publishing.
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页数:5
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