Optical projection lithography at half the Rayleigh resolution limit by two-photon exposure

被引:74
|
作者
Yablonovitch, E [1 ]
Vrijen, RB [1 ]
机构
[1] Univ Calif Los Angeles, Dept Elect Engn, Los Angeles, CA 90095 USA
关键词
photolithography; two-photon absorption;
D O I
10.1117/1.602092
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Photographic media can be exposed by two-photon absorption, rather than the more usual one-photon absorption. This leads to the question of whether the simultaneous absorption of a pair of photons could be accompanied by a twofold spatial-resolution enhancement. We find that ordinary two-photon absorption merely enhances the photographic contrast, or gamma. While this improves the spatial resolution somewhat, it does so at the expense of requiring tighter control over the incident light intensity. Instead, we introduce a new type of exposure arrangement employing a multiplicity of two-photon excitation frequencies, which interfere with one another to produce a stationary image that exhibits a true doubling of the spatial resolution. (C) 1999 Society of Photo-Optical instrumentation Engineers. [S0091-3286(99)00402-X].
引用
收藏
页码:334 / 338
页数:5
相关论文
共 50 条
  • [1] Optical lithography at half the Rayleigh resolution limit by two-photon absorption resist
    Ezaki, H
    Shibuya, M
    OPTICAL MICROLITHOGRAPHY XVI, PTS 1-3, 2003, 5040 : 1270 - 1275
  • [2] Beating the Rayleigh Limit Using Two-Photon Interference
    Parniak, Michal
    Borowka, Sebastian
    Boroszko, Kajetan
    Wasilewski, Wojciech
    Banaszek, Konrad
    Demkowicz-Dobrzanski, Rafal
    PHYSICAL REVIEW LETTERS, 2018, 121 (25)
  • [3] Two-photon laser lithography in optical metrology
    Hering, Julian
    Eifler, Matthias
    Hofherr, Linda
    Ziegler, Christiane
    Seewig, Joerg
    von Freymann, Georg
    ADVANCED FABRICATION TECHNOLOGIES FOR MICRO/NANO OPTICS AND PHOTONICS XI, 2018, 10544
  • [4] Defect control during femtosecond projection two-photon lithography
    Kim, Harnjoo
    Saha, Sourabh K.
    48TH SME NORTH AMERICAN MANUFACTURING RESEARCH CONFERENCE, NAMRC 48, 2020, 48 : 650 - 655
  • [5] MINIMIZING SHRINKAGE IN MICROSTRUCTURES PRINTED WITH PROJECTION TWO-PHOTON LITHOGRAPHY
    Kim, Harnjoo
    Saha, Sourabh K.
    PROCEEDINGS OF ASME 2022 17TH INTERNATIONAL MANUFACTURING SCIENCE AND ENGINEERING CONFERENCE, MSEC2022, VOL 1, 2022,
  • [6] Resolution and aspect ratio in two-photon lithography of positive photoresist
    Aumann, Andreas
    Ksouri, Sarah Isabelle
    Guo, Qingchuan
    Sure, Christian
    Gurevich, Evgeny L.
    Ostendorf, Andreas
    JOURNAL OF LASER APPLICATIONS, 2014, 26 (02)
  • [7] Beyond the Rayleigh Limit in Optical Lithography
    Al-Amri, Mohammad
    Liao, Zeyang
    Zubairy, M. Suhail
    ADVANCES IN ATOMIC, MOLECULAR, AND OPTICAL PHYSICS, VOL 61, 2012, 61 : 409 - 466
  • [8] Optical Threshold Layer and Intermediate State Two-Photon PAG Approaches to Double Exposure Lithography
    Berro, Adam J.
    Gu, Xinyu
    O'Connor, Naphtali
    Jockusch, Steffen
    Nagai, Tomoki
    Ogata, Toshiyuki
    Zimmerman, Paul
    Rice, Bryan J.
    Adolph, Elizabeth
    Byargeon, Travis
    Gonzalez, Jose
    Turro, Nicolas J.
    Willson, C. Grant
    ADVANCES IN RESIST MATERIALS AND PROCESSING TECHNOLOGY XXVI, 2009, 7273
  • [9] Demonstration of two-photon lithography
    Schwarz, CJ
    Nampoothiri, AVV
    Jasapara, JC
    Rudolph, W
    Brueck, SRJ
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (06): : 2362 - 2365
  • [10] Two-photon diffraction and quantum lithography
    D'Angelo, M
    Chekhova, MV
    Shih, Y
    PHYSICAL REVIEW LETTERS, 2001, 87 (01)