Challenges and Opportunities with Concolic Testing

被引：0
|
作者：
Kannavara, Raghudeep [1 ]
Havlicek, Christopher J. [1 ]
Chen, Bo [2 ]
Tuttle, Mark R. [1 ]
Cong, Kai [1 ]
Ray, Sandip [1 ]
Xie, Fei [2 ]
机构：
[1] Intel Corp, 2111 NE 25th Ave, Hillsboro, OR 97124 USA
[2] Portland State Univ, Portland, OR 97201 USA
来源：
PROCEEDINGS OF THE 2015 IEEE NATIONAL AEROSPACE AND ELECTRONICS CONFERENCE (NAECON) | 2015年
关键词：
concolic testing; security testing; dynamic analysis; pre-silicon validation; malware analysis; firmware testing;
D O I：
暂无
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
Although concolic testing is increasingly being explored as a viable software verification technique, its adoption in mainstream software development and testing in the industry is not yet extensive. In this paper, we discuss challenges to widespread adoption of concolic testing in an industrial setting and highlight further opportunities where concolic testing can find renewed applicability.
引用
收藏
页码：374 / 378
页数：5
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