Easy mixed signal test creation with test elements and procedures

被引：1
|
作者：
Kittross, P [1 ]
机构：
[1] Teradyne Inc, Boston, MA 02118 USA
来源：
INTERNATIONAL TEST CONFERENCE 2000, PROCEEDINGS | 2000年
关键词：
D O I：
10.1109/TEST.2000.894193
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
A test engineer who creates complex mixed-signal tests by grouping graphical Test Elements into custom Test Procedures combines the ease-of-use of GUI-based Template programming with the flexibility and power of a code-based approach.
引用
收藏
页码：72 / 79
页数：8
相关论文
共 50 条
  • [21] Formal description of test specification and ATE architecture for mixed-signal test
    Deng, BL
    Glauert, W
    INTERNATIONAL TEST CONFERENCE 2004, PROCEEDINGS, 2004, : 1081 - 1090
  • [22] Test papers target mixed-signal, design-for-test topics
    Novellino, J
    ELECTRONIC DESIGN, 1997, 45 (09) : 73 - 74
  • [23] Test waveform shaping in mixed signal test bus by pre-equalization
    Chen, YT
    Su, CC
    19TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2001, : 260 - 265
  • [24] Mixed-signal test bus, embedded core test efforts advance
    Modi, M
    IEEE DESIGN & TEST OF COMPUTERS, 1999, 16 (02): : 5 - +
  • [25] IS IT EASY TO PASS SUCH A TEST?
    Tamarchenko, N. D.
    NOVYI FILOLOGICHESKII VESTNIK-NEW PHILOLOGICAL BULLETIN, 2006, (02):
  • [26] An easy consciousness test?
    Underwood, Emily
    SCIENCE, 2014, 346 (6209) : 531 - 532
  • [27] Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture
    Jari Hannu
    Teuvo Saikkonen
    Juha Häkkinen
    Juha Karttunen
    Markku Moilanen
    Journal of Electronic Testing, 2010, 26 : 641 - 658
  • [28] A Boundary-Scan Test Bus Controller Design for Mixed-Signal Test
    Chen Shengjian
    Xu Lei
    2010 IEEE INTERNATIONAL CONFERENCE ON WIRELESS COMMUNICATIONS, NETWORKING AND INFORMATION SECURITY (WCNIS), VOL 2, 2010, : 22 - 25
  • [29] Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture
    Hannu, Jari
    Saikkonen, Teuvo
    Hakkinen, Juha
    Karttunen, Juha
    Moilanen, Markku
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2010, 26 (06): : 641 - 658
  • [30] Adaptive Test Flow for Mixed-Signal ICs
    Stratigopoulos, Haralampos-G.
    Streitwieser, Christian
    2017 IEEE 35TH VLSI TEST SYMPOSIUM (VTS), 2017,
12345