Energy-filtered electron backscatter diffraction (vol 108, pg 116, 2008)

被引：0
|
作者：
Deal, Andrew [1 ]
Hooghan, Tejpal [2 ]
Eades, Alwyn [3 ]
机构：
[1] GE Global Res, Niskayuna, NY 12309 USA
[2] Texas Instrument Inc, Dallas, TX 75243 USA
[3] Lehigh Univ, Dept Mat Sci & Engn, Bethlehem, PA 18015 USA
来源：
ULTRAMICROSCOPY | 2008年 / 108卷 / 07期
关键词：
D O I：
10.1016/j.ultramic.2008.02.001
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
下载
收藏
页码：706 / 706
页数：1
相关论文
共 50 条
  • [1] Energy-filtered electron backscatter diffraction
    Deal, Andrew
    Hooghan, Tejpal
    Eades, Alwyn
    ULTRAMICROSCOPY, 2008, 108 (02) : 116 - 125
  • [2] Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns
    Vespucci, S.
    Winkelmann, A.
    Naresh-Kumar, G.
    Mingard, K. P.
    Maneuski, D.
    Edwards, P. R.
    Day, A. P.
    O'Shea, V.
    Trager-Cowan, C.
    PHYSICAL REVIEW B, 2015, 92 (20):
  • [3] Aberration-corrected and energy-filtered precession electron diffraction
    Eggeman, Alexander S.
    Barnard, Jonathan S.
    Midgley, Paul A.
    ZEITSCHRIFT FUR KRISTALLOGRAPHIE-CRYSTALLINE MATERIALS, 2013, 228 (01): : 43 - 50
  • [4] Structure analysis of inorganic crystals by energy-filtered precession electron diffraction
    Kim, Jin-Gyu
    Song, Kyung
    Kwon, Kihyun
    Hong, Kimin
    Kim, Youn-Joong
    JOURNAL OF ELECTRON MICROSCOPY, 2010, 59 (04): : 273 - 283
  • [5] ENERGY-FILTERED ELECTRON-DIFFRACTION STUDY OF VITREOUS AND AMORPHIZED SILICAS
    QIN, LC
    HOBBS, LW
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 1995, 193 : 456 - 462
  • [6] DYNAMIC SIMULATIONS OF ENERGY-FILTERED INELASTIC ELECTRON-DIFFRACTION PATTERNS
    WANG, ZL
    ACTA CRYSTALLOGRAPHICA SECTION A, 1992, 48 : 674 - 688
  • [7] ENERGY-FILTERED CONVERGENT-BEAM ELECTRON-DIFFRACTION IN STEM
    XU, PR
    LOANE, RF
    SILCOX, J
    ULTRAMICROSCOPY, 1991, 38 (02) : 127 - 133
  • [8] DEVELOPMENT OF ENERGY-FILTERED REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION APPARATUS
    HORIO, Y
    HASHIMOTO, Y
    SHIBA, K
    ICHIMIYA, A
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1995, 34 (10): : 5869 - 5870
  • [9] Improving Accuracy and Precision of Strain Analysis by Energy-Filtered Nanobeam Electron Diffraction
    Haehnel, Angelika
    Reiche, Manfred
    Moutanabbir, Oussama
    Blumtritt, Horst
    Geisler, Holm
    Hoentschel, Jan
    Engelmann, Hans-Juergen
    MICROSCOPY AND MICROANALYSIS, 2012, 18 (01) : 229 - 240
  • [10] Energy-filtered electron interferometry in reflection electron microscopy
    Suzuki, T
    Tanishiro, Y
    Ishiguro, N
    Minoda, H
    Yagi, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2001, 40 (4A): : 2527 - 2532
12345