Effect of magnesium in KOH solution on anisotropic wet etching of silicon

被引:0
|
作者
Tanaka, H [1 ]
Cheng, D [1 ]
Inoue, K [1 ]
Shikida, M [1 ]
Sato, K [1 ]
机构
[1] Nagoya Univ, Dept MicroNano Syst Engn, Chikusa Ku, Nagoya, Aichi 4648603, Japan
关键词
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Etching characteristics of Si in KOH solution containing Mg are investigated. Etch rate of silicon slightly decreases by the Mg on the order of 10 ppm in 32 wt.% KOH,while the etched surface roughness does not change in contrast to Cu as an impurity. The surface roughening caused by the ppb-level of Cu in KOH solution can be fully recovered by adding Mg on the order of 10 ppm in the solution.
引用
收藏
页码:121 / 125
页数:5
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