Thickness dependence of polarization and response characteristics in thin FLC films

被引：4
|
作者：
Pikin, S
Osipov, M
Biradar, A
Beresnev, L
Haase, W
机构：
[1] Russian Acad Sci, Inst Crystallog, Moscow 117333, Russia
[2] Natl Phys Lab, New Delhi 110012, India
[3] TH Darmstadt, Inst Phys Chem, D-64287 Darmstadt, Germany
来源：
FERROELECTRICS | 1998年 / 212卷 / 1-4期
关键词：
thin film ferroelectrics; surface tension; liquid crystals;
D O I：
10.1080/00150199808217348
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The effects of cell thickness on the pretransitional behaviour of ferroelectric liquid crystals are studied experimentally and theoretically for thin cells. The temperature and field dependences of the tilt angle, polarization, polarization to tilt angle ratio, dielectric permeability and relaxation frequency are considered in detail in the framework of a simple model for the surface tension. Apparent values of the phenomenological coefficients in the free energy expansion and some bulk and surface material parameters are estimated.
引用
收藏
页码：29 / 36
页数：8
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