Reduced Master Equation for Modeling of Ferromagnetic Single-Electron Transistor

被引:0
|
作者
Asgari, Sommayeh [1 ]
Faez, Rahim [1 ]
机构
[1] Sharif Univ Technol, Tehran, Iran
来源
关键词
Ferromagnetic single electron transistor; Master equation method; Single electron transistor; simulation; sequential tunneling regime; COULOMB STAIRCASE; ROOM-TEMPERATURE; TRANSPORT; BLOCKADE;
D O I
10.4028/www.scientific.net/AMM.110-116.3103
中图分类号
V [航空、航天];
学科分类号
08 ; 0825 ;
摘要
In this paper, the reduced master equation which is a fast simulation method of spin dependent transport in ferromagnetic single electron transistors is presented, for first time. This simulation method follows steady state master equation in which all charge states of the system are considered, whereas charge states are decreased in reduced master equation. This method. is based on two degrees of electron freedom which are charge and spin. This is applied in the condition that orthodox tunneling theory is applicable to calculate the tunneling rate of electrons through barriers. The comparison between the I-V characteristics of a ferromagnetic single-electron transistor by following the reduced and full master equation methods for different main parameters of these transistors show that the results are exactly the same at low bias voltages. Consequently, the reduced master equation method is not only more simplified and improves the speed of numerical simulation, but also the modeling results are as accurate as the results of the full maser equation method at low bias conditions.
引用
收藏
页码:3103 / 3110
页数:8
相关论文
共 50 条
  • [31] Quantum conductance of the single-electron transistor
    Wang, XH
    PHYSICAL REVIEW B, 1997, 55 (19): : 12868 - 12871
  • [32] Current Analysis and Modeling of Fullerene Single-Electron Transistor at Room Temperature
    Vahideh Khadem Hosseini
    Mohammad Taghi Ahmadi
    Saeid Afrang
    Razali Ismail
    Journal of Electronic Materials, 2017, 46 : 4294 - 4298
  • [33] Broadband single-electron tunneling transistor
    Visscher, EH
    Lindeman, J
    Verbrugh, SM
    Hadley, P
    Mooij, JE
    vanderVleuten, W
    APPLIED PHYSICS LETTERS, 1996, 68 (14) : 2014 - 2016
  • [34] The Kondo effect in a single-electron transistor
    Goldhaber-Gordon, D
    Göres, J
    Shtrikman, H
    Mahalu, D
    Meirav, U
    Kastner, MA
    KONDO EFFECT AND DEPHASING IN LOW-DIMENSIONAL METALLIC SYSTEMS, 2001, 50 : 163 - 170
  • [35] Sketched oxide single-electron transistor
    Cheng, Guanglei
    Siles, Pablo F.
    Bi, Feng
    Cen, Cheng
    Bogorin, Daniela F.
    Bark, Chung Wung
    Folkman, Chad M.
    Park, Jae-Wan
    Eom, Chang-Beom
    Medeiros-Ribeiro, Gilberto
    Levy, Jeremy
    NATURE NANOTECHNOLOGY, 2011, 6 (06) : 343 - 347
  • [36] Effective capacitance of a single-electron transistor
    Laakso, M. A.
    Ojanen, T.
    Heikkila, T. T.
    PHYSICAL REVIEW B, 2008, 77 (23):
  • [37] Cotunneling at resonance for the single-electron transistor
    Konig, J
    Schoeller, H
    Schon, G
    PHYSICAL REVIEW LETTERS, 1997, 78 (23) : 4482 - 4485
  • [38] Kondo effect in a single-electron transistor
    D. Goldhaber-Gordon
    Hadas Shtrikman
    D. Mahalu
    David Abusch-Magder
    U. Meirav
    M. A. Kastner
    Nature, 1998, 391 : 156 - 159
  • [39] CHARGE SENSITIVITY OF A SINGLE-ELECTRON TRANSISTOR
    HANKE, U
    GALPERIN, YM
    CHAO, KA
    APPLIED PHYSICS LETTERS, 1994, 65 (14) : 1847 - 1849
  • [40] The Kondo effect in a single-electron transistor
    Goldhaber-Gordon, D
    Göres, J
    Shtrikman, H
    Mahalu, D
    Meirav, U
    Kastner, MA
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2001, 84 (1-2): : 17 - 21