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Anomalous Dependence of Threshold Voltage Mismatch of Short-Channel Transistors
被引:4
|作者:
Hook, Terence B.
[1
]
Johnson, Jeffrey B.
[1
]
Shah, Jay
[1
]
机构:
[1] IBM Microelect, Essex Jct, VT 05452 USA
关键词:
CMOSFETs;
doping;
transistors;
D O I:
10.1109/TED.2011.2148120
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
In contrast to the generally accepted expectation that mismatch is monotonically related to doping level for uniformly doping channels, apparently anomalous results in which short-channel low-doped devices have larger mismatch than higher doped high-threshold devices are shown. However, these results are fully explained and comprehended in the context of device design and random dopant fluctuation, and the correlation of short-channel effect with mismatch suggests yet another manner in which fully depleted undoped-body devices will offer better variation than classic scaled dopant-driven transistors, addressing a critical problem in new technology directions.
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页码:2805 / 2807
页数:3
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