Neutralization rate for slow Ar+ ions in front of KCl(001)

被引：0

作者：

Tsujioka, T ^{[1
]}

Tanaka, S ^{[1
]}

Nakamoto, A ^{[1
]}

Nakajima, K ^{[1
]}

Suzuki, M ^{[1
]}

Kimura, K ^{[1
]}

机构：

[1] Kyoto Univ, Dept Engn Phys & Mech, Kyoto 6068501, Japan

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2005年 / 230卷

关键词：

neutralization rate; KCl(001); grazing angle scattering; Ar+;

D O I：

10.1016/j.nimb.2004.12.068

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Charge state distributions of reflected ions are measured when 5 keV Arq+(q = 0-2) ions are incident on a clean KCl(001) surface at grazing angle, theta(i). Although the charge state distribution does not depend on the incident charge state at larger theta(i), significant dependence of the charge state distribution on incident charge state is observed at smaller theta(i). The ionization of Ar-0 is completely suppressed at theta(i) < 20 mrad, while large neutralization probability is observed for Ar+ incidence. These features allow us to derive the position-dependent neutralization rate of Ar+ in front of KCl(001). The obtained neutralization rate decreases exponentially with distance from the surface as it is usually assumed. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：369 / 372

页数：4

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