A technique for producing ordered arrays of metallic nanoclusters by electroless deposition in focused ion beam patterns

被引:11
|
作者
Weller, RA
Ryle, WT
Newton, AT
McMahon, MD
Miller, TM
Magruder, RH
机构
[1] Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37235 USA
[2] Western Kentucky Univ, Bowling Green, KY 42101 USA
[3] Vanderbilt Univ, Dept Biomed Engn, Nashville, TN 37235 USA
[4] Vanderbilt Univ, Dept Phys, Nashville, TN 37235 USA
[5] Vanderbilt Univ, Dept Mech Engn, Nashville, TN 37235 USA
[6] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA
[7] Belmont Univ, Dept Phys, Nashville, TN 37212 USA
关键词
electroless deposition; focused ion beam; nanocrystal arrays; nanotechnology;
D O I
10.1109/TNANO.2003.817528
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Ordered arrays of An nanoclusters have been prepared on Si substrates using a combination of focused ion beam (FIB) surface processing and electroless deposition. Particles varying in size from approximately 30 to 100 nm have been produced in regular grid patterns whose geometry is controlled to high precision by the FIB. Potential applications range from engineering of the surface plasmon resonance for numerous optical applications to building structures for tethering organic molecules in specific geometric arrangements.
引用
收藏
页码:154 / 157
页数:4
相关论文
共 50 条
  • [31] A comparison of focused ion beam and electron beam induced deposition processes
    Lipp, S
    Frey, L
    Lehrer, C
    Demm, E
    Pauthner, S
    Ryssel, H
    MICROELECTRONICS AND RELIABILITY, 1996, 36 (11-12): : 1779 - 1782
  • [32] Fabrication of Metallic Nanodot Structures Using Focused Ion Beam (FIB) and Electron Beam-induced Deposition for Plasmonic Waveguides
    Dhawan, Anuj
    Gerhold, Michael
    Russell, Phillip
    Tuan Vo-Dinh
    Leonard, Donovan
    QUANTUM DOTS, PARTICLES, AND NANOCLUSTERS VI, 2009, 7224
  • [33] FOCUSED ION-BEAM LITHOGRAPHY WITH OXIDE RESISTS AND ITS APPLICATION TO FABRICATION OF FINE METALLIC PATTERNS
    YOSHIDA, K
    WATANUKI, S
    KOSHIDA, N
    KOMURO, M
    ATODA, N
    DENKI KAGAKU, 1991, 59 (07): : 614 - 618
  • [34] Focused-ion-beam-enabled electroless growth of gold nanoparticles on silicon
    Nishi, Masayuki
    JOURNAL OF THE CERAMIC SOCIETY OF JAPAN, 2018, 126 (08) : 614 - 624
  • [35] Novel Patterns by Focused Ion Beam Guided Anodization
    Chen, Bo
    Lu, Kathy
    Tian, Zhipeng
    LANGMUIR, 2011, 27 (02) : 800 - 808
  • [36] Thinning of surface cones by the focused ion beam technique
    Imai, A
    Kamiya, C
    Fujimoto, Y
    Okuyama, F
    SURFACE SCIENCE, 2000, 461 (1-3) : L515 - L520
  • [37] Ordered SrTiO3 Nanoripples Induced by Focused Ion Beam
    Jiang Wu
    Gang Chen
    Zhaoquan Zeng
    Shibin Li
    Xingliang Xu
    Zhiming M. Wang
    Gregory J. Salamo
    Nano-Micro Letters, 2012, 4 : 243 - 246
  • [38] Ordered SrTiO3 Nanoripples Induced by Focused Ion Beam
    Jiang Wu
    Gang Chen
    Zhaoquan Zeng
    Shibin Li
    Xingliang Xu
    Zhiming M.Wang
    Gregory J.Salamo
    Nano-Micro Letters, 2012, (04) : 243 - 246
  • [39] Ordered SrTiO3 Nanoripples Induced by Focused Ion Beam
    Wu, Jiang
    Chen, Gang
    Zeng, Zhaoquan
    Li, Shibin
    Wu, Xingliang
    Wang, Zhiming M.
    Salamo, Gregory J.
    NANO-MICRO LETTERS, 2012, 4 (04) : 243 - 246
  • [40] Focused-ion-beam-induced deposition of superconducting nanowires
    Sadki, ES
    Ooi, S
    Hirata, K
    APPLIED PHYSICS LETTERS, 2004, 85 (25) : 6206 - 6208