Exchange Bias in Bilayer and Multilayer NiFe/IrMn

被引:3
|
作者
Rigue, J. N. [1 ]
Beck, F. [2 ]
de Andrade, A. M. H. [3 ]
Kern, P. R. [4 ]
Siqueira, J. V. [4 ]
Carara, M. [4 ]
机构
[1] Inst Fed Farroupilha, BR-98590000 Santo Augusto, RS, Brazil
[2] Univ Fed Pampa, PPG Engn, BR-97546550 Alegrete, RS, Brazil
[3] Univ Fed Rio Grande do Sul, Inst Fis, BR-91501970 Porto Alegre, RS, Brazil
[4] Univ Fed Santa Maria, Dept Fis, BR-97105900 Santa Maria, RS, Brazil
关键词
Magnetization dynamics; exchange bias; rotational hysteresis; torque measurements; unidirectional anisotropy; THIN-FILMS; ANISOTROPY;
D O I
10.1109/LMAG.2015.2397396
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The exchange bias effect in bilayer and multilayer samples of NiFe/IrMn was studied. Using techniques such as torque magnetometry, anisotropic magnetoresistance, and magnetization curves, a simple model valid for polycrystalline samples was used to fit the experimental curves. The model considers, beyond the stable grains, the presence of unstable ones at the ferro/antiferromagnetic interface, which gives rise to rotational hysteresis in the torque curves. From the obtained parameters, it was possible to evaluate and compare how the stacking of the layers affects the coupling of the ferromagnetic layers with the two kinds of interfacial grains.
引用
收藏
页数:4
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