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Terahertz conductivity of thin metal films

被引：158
|
作者：
Laman, N. [1 ]
Grischkowsky, D. [1 ]
机构：
[1] Oklahoma State Univ, Sch Elect & Comp Engn, Stillwater, OK 74078 USA
来源：
APPLIED PHYSICS LETTERS | 2008年 / 93卷 / 05期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1063/1.2968308
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The conductivities of thin Al, Au, and Ag films were measured via their transmission at terahertz frequencies. The conductivities of all the films, particularly the thinner films and Al films, were much smaller than their bulk dc values. This reduced conductivity can be quantitatively understood in terms of an increased scattering rate from defects. The transmission is consistent with a frequency independent conductivity, implying a very fast electron scattering time. (c) 2008 American Institute of Physics.
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页数：3
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