Measurement of characteristic X-rays by positron impact

被引：5

作者：

Nagashima, Y

Saito, F

Itoh, Y

Goto, A

Hyodo, T

机构：

[1] Univ Tokyo, Grad Sch Arts & Sci, Inst Phys, Meguro Ku, Tokyo 1538902, Japan

[2] RIKEN, Wako, Saitama 3510198, Japan

来源：

POSITRON ANNIHILATION, ICPA-13, PROCEEDINGS | 2004年 / 445-6卷

关键词：

characteristic X-rays; inner-shell ionization cross-section;

D O I：

10.4028/www.scientific.net/MSF.445-446.440

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An X-ray detector with thin Si(Li) crystals has been fabricated and employed to detect the characteristic X-rays by positron impact. Use of thin detector crystals is essential for the measurements of the characteristic X-rays induced by positron impact. Otherwise the background produced in the crystals by the annihilation gamma-rays is too large to isolate the X-ray peaks. The data has been analyzed to obtain the inner-shell ionization cross sections by positron impact.

引用

页码：440 / 442

页数：3

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