On Levy processes conditioned to stay positive (vol 13, pg 1, 2008)

被引:0
|
作者
Chaumont, L. [1 ]
Doney, R. A. [2 ]
机构
[1] Univ Angers, LAREMA, F-49045 Angers 01, France
[2] Univ Manchester, Dept Math, Manchester M13 9PL, Lancs, England
来源
关键词
Levy process conditioned to stay positive; weak convergence; excursion measure;
D O I
暂无
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
We correct two errors of omission in our paper, [2].
引用
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页数:4
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