Surface enhanced Raman with anodized aluminum oxide films

被引:26
|
作者
Zhang, C. [1 ]
Abdijalilov, K. [1 ]
Grebel, H. [1 ]
机构
[1] New Jersey Inst Technol, Elect Imaging Ctr, Newark, NJ 07102 USA
来源
JOURNAL OF CHEMICAL PHYSICS | 2007年 / 127卷 / 04期
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.2752498
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Aluminum is not a platform of choice for surface enhanced Raman scattering (SERS) experiments despite its large negative permittivity value (larger than gold or silver at optical wavelengths). It is also widely believed that an oxide layer on top of any platform substantially impedes SERS signals. Yet, anodized aluminum oxide may be perforated in an organized fashion and we have used it to examine SERS of single walled carbon nanotubes (SWCNTs) at micron length and fullerene (C-60) at the nanoscale. The signal-to-noise ratio of the corresponding Raman signals exhibited a large signal enhancement for SWCNTs but not for C-60. We attributed the SERS to the formation of standing surface charge waves in this subwavelength environment. (c) 2007 American Institute of Physics.
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页数:5
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