Modeling of the electronic properties of vertical quantum dots by the finite element method

被引:0
|
作者
Matagne, P [1 ]
Leburton, JP
Destine, J
Cantraine, G
机构
[1] Univ Liege, Inst Montefiore, B-4000 Liege, Belgium
[2] Univ Illinois, Dept Elect & Comp Engn, Urbana, IL 61801 USA
[3] Univ Illinois, Beckman Inst Adv Sci & Technol, Urbana, IL 61801 USA
[4] Univ Liege, Dept Elect & Comp Engn, B-4000 Liege, Belgium
来源
关键词
quantum dot; finite element; single-electron charging;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We investigate the quantum mechanical properties and single-electron charging effects in vertical semiconductor quantum dots by solving the Schrodinger and Poisson (SP) equations, self-consistently. We use the finite element method (FEM), specifically the Bubnov-Galerkin technique to discretize the SP equations. Owing to the cylindrical symmetry of the structure, the mesh is generated from hexahedral volume elements. The fine details of the electron spectrum and wavefunctions in the quantum dot are obtained as a function of macroscopic parameters such as the gate voltage, device geometry and doping level. The simulations provide comprehensive data for the analysis of the experimental data of Tarucha, Austing, Honda, van der Hage, and Kouwenhoven (1996).
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页码:1 / 10
页数:10
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