In-situ shape measurement technology during large aperture optical planar continuous polishing process

被引:0
|
作者
Xie, Ruiqing [1 ,2 ]
Liao, Defeng [1 ,3 ]
Chen, Jian [4 ]
Zhao, Shijie [1 ]
Chen, Xianhua [1 ]
Ji, Baojian [1 ]
Wang, Jian [1 ]
Xu, Qiao [1 ]
机构
[1] Fine Opt Engn Res Ctr, Chengdu 610041, Peoples R China
[2] Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710054, Shaanxi, Peoples R China
[3] Harbin Inst Technol, Dept Mech Engn, Harbin 150001, Heilongjiang, Peoples R China
[4] Shanghai Jing Opt & Mech CO LTD, Shanghai 201802, Peoples R China
来源
YOUNG SCIENTISTS FORUM 2017 | 2018年 / 10710卷
关键词
continuous polishing; optical components; pitch lap; surface figure; in-situ measurement;
D O I
10.1117/12.2317629
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Continuous polishing technology is an important means to realize batch processing of large aperture and high precision planar optical components. However, traditional continuous polishing process largely depends on the operator's experience, with poor controllability of component surface figure and unstable processing efficiency. In order to solve this problem, the in-situ shape measurement technologies including measurement of pitch lap surface figure and workpiece surface figure have been proposed in this paper. The real-time states of the pitch lap flatness and the workpiece surface figure in polishing process are obtained by in-situ measurement technologies, which provide the quantitative informations for adjusting process parameters. In the experiment, a large aperture mirror (material as K9; size as 800mmx400mmx100mm) was polished. The results show that the surface figure of the component was improved from lambda/2 (1 lambda= 632.8nm) to lambda/6 by using the in-situ measurement technologies during the continous polishing process.
引用
收藏
页数:6
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