共 23 条
An efficient design of dual-axis MEMS accelerometer considering microfabrication process limitations and operating environment variations
被引:6
|作者:
Tahir, Muhammad Ahmad Raza
[1
]
Saleem, Muhammad Mubasher
[2
,3
]
Bukhari, Syed Ali Raza
[1
]
Hamza, Amir
[2
,3
]
Shakoor, Rana Iqtidar
[3
,4
]
机构:
[1] Natl Univ Sci & Technol, Islamabad, Pakistan
[2] Natl Univ Sci & Technol, Dept Mechatron Engn, Islamabad, Pakistan
[3] Natl Ctr Robot & Automat NCRA, Islamabad, Pakistan
[4] Air Univ, Islamabad, Pakistan
关键词:
MEMS;
Sensors;
Microfabrication;
Reliability;
Design;
FEM simulations;
Readout electronics;
Semiconductor technology;
Thick;
thin film sensors;
OPTIMIZATION;
FILM;
D O I:
10.1108/MI-02-2021-0023
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Purpose This paper aims to present an efficient design approach for the micro electromechanical systems (MEMS) accelerometers considering design parameters affecting the long-term reliability of these inertial sensors in comparison to traditional iterative microfabrication and experimental characterization approach. Design/methodology/approach A dual-axis capacitive MEMS accelerometer design is presented considering the microfabrication process constraints of the foundry process. The performance of the MEMS accelerometer is analyzed through finite element method- based simulations considering main design parameters affecting the long-term reliability. The effect of microfabrication process induced residual stress, operating pressure variations in the range of 10 mTorr to atmospheric pressure, thermal variations in the operating temperature range of -40 degrees C to 100 degrees C and impulsive input acceleration at different input frequency values is presented in detail. Findings The effect of residual stress is negligible on performance of the MEMS accelerometer due to efficient design of mechanical suspension beams. The effect of operating temperature and pressure variations is negligible on energy loss factor. The thermal strain at high temperature causes the sensing plates to deform out of plane. The input dynamic acceleration range is 34 g at room temperature, which decreases with operating temperature variations. At low frequency input acceleration, the input acts as a quasi-static load, whereas at high frequency, it acts as a dynamic load for the MEMS accelerometer. Originality/value In comparison with the traditional MEMS accelerometer design approaches, the proposed design approach focuses on the analysis of critical design parameters that affect the long-term reliability of MEMS accelerometer.
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页码:144 / 156
页数:13
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