Preparation and characterization of LaNiO3 films grown by metal-organic deposition

被引：8
|
作者：
Wang, Yao [1 ,2 ]
Zhang, Guofang [1 ,2 ]
Li, Chengshan [3 ]
Yan, Guo [3 ]
Lu, Yafeng [3 ]
机构：
[1] Shaanxi Normal Univ, Key Lab Appl Surface & Colloid Chem, Minist Educ, Xian 710062, Peoples R China
[2] Shaanxi Normal Univ, Sch Chem & Chem Engn, Xian 710062, Peoples R China
[3] NW Inst Nonferrous Met Res, Xian 710016, Peoples R China
来源：
BULLETIN OF MATERIALS SCIENCE | 2011年 / 34卷 / 07期
关键词：
Conductive films; LaNiO3; metal-organic deposition; texture; THIN-FILMS; ELECTRODES; DECOMPOSITION; QUALITY; OXIDE;
D O I：
10.1007/s12034-011-0332-9
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We have investigated the synthesis and characterization of LaNiO3 (LNO) layers deposited on YSZ (100) substrate by metal organic deposition (MOD). Texture, morphology and electrical properties of the LaNiO3 films were characterized by X-ray diffraction (XRD), atomic force microscopy (AFM), scanning electron microscopy (SEM) and electrical resistivity measurement. It has been found that the formation of (h00) orientation depends on pyrolysis temperature, annealing temperature and thickness of LaNiO3 layers. The LaNiO3 films prepared under optimal condition indicate highly (h00) orientation and a rather smooth surface. The LaNiO3 films show a metallic behaviour in the measured temperature range.
引用
收藏
页码：1379 / 1383
页数：5
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