Compact phase-contrast soft X-ray microscopy

被引：1

作者：

von Hofsten, O. ^{[1
]}

Bertilson, M. ^{[1
]}

Lindblom, M. ^{[1
]}

Holmberg, A. ^{[1
]}

Hertz, H. M. ^{[1
]}

Vogt, U. ^{[1
]}

机构：

[1] Royal Inst Technol Albanova, Dept Appl Phys, SE-10691 Stockholm, Sweden

来源：

9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY | 2009年 / 186卷

关键词：

DIFFRACTIVE OPTICAL-ELEMENTS;

D O I：

10.1088/1742-6596/186/1/012038

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

For nearly all elements, the real part, delta, of the complex index of refraction n (n = 1 - delta + i beta) is larger than the imaginary part, beta, in the x-ray region. Since only beta is used in absorption contrast, phase-contrast imaging techniques which give access to delta are very important. In this paper we present two different implementations of phase contrast in our compact soft x-ray microscope, differential-interference contrast and Zemike phase contrast.

引用

页数：3

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