Small-angle X-ray scattering of synchrotron light on nanostructured V/Ce oxide films

被引：0
|
作者：
Turkovic, A
Hrestak, K
Dubcek, P
Orel, ZC
机构：
[1] Rudjer Boskovic Inst, HR-10002 Zagreb, Croatia
[2] Univ Zagreb, Fac Sci, Dept Phys, HR-10001 Zagreb, Croatia
[3] Natl Inst Chem, SI-1001 Ljubljana, Slovenia
来源：
STROJARSTVO | 2002年 / 44卷 / 3-6期
关键词：
dip-coating; SAXS; synchrotron source; thin films; V/Ce-oxide;
D O I：
暂无
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
SAXS (small-angle X-ray scattering) data for V/Ce nanostructured oxide films were taken with a Gabriel type, gas filled 1D detector at synchrotron Elettra. SAXS data for mixed V/Ce oxides were taken in a sequence of fixed grazing angles. In this work the average grain size [R] and specific surface S-s for V/Ce oxide at 38 at. % of vanadium were determined by SAXS.
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页码：211 / 217
页数：7
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