Single counts of radicle emergence can be used as a vigour test to predict seedling emergence potential of wheat

A study was carried out to investigate the use of single counts of radicle emergence to test seed vigour and predict seedling establishment of wheat (Triticum aestivum L.) seed lots. We compared the counts of radicle emergence at 20 degrees C for 36 and 48 hours, and at 13 degrees C for 66 and 72 hours with germination energy (GE), germination percentage (GP), germination index (GI), vigour index (VI), mean germination time (MGT), complex stressing vigour test (CSVT), relative of electrical conductivity (REC), accelerated aging test (AA) and field emergence (FE) using seven wheat seed lots. Radicle emergence counts after 36 and 48 hours at 20 degrees C and 66 and 72 hours at 13 degrees C correlated highly with four seed vigour parameters above (CSVT, REC, AA and FE), with correlation coefficients bigger than 0.75 (P < 0.05). The most significant correlation coefficients were obtained after 48 hours at 20 degrees C and 72 hours at 13 degrees C. Our results indicated that single counts of radicle emergence could be applied to test the wheat seed vigour. In addition, single counts of radicle emergence were proved to be a useful indicator of seedling emergence potential of wheat.