Single counts of radicle emergence can be used as a vigour test to predict seedling emergence potential of wheat

被引:14
|
作者
Guan, Y. J. [1 ]
Yin, M. Q. [1 ]
Jia, X. W. [1 ]
An, J. Y. [1 ]
Wang, C. [1 ]
Pan, R. H. [1 ]
Song, W. J. [1 ]
Hu, J. [1 ]
机构
[1] Zhejiang Univ, Seed Sci Ctr, Coll Agr & Biotechnol, Hangzhou 310058, Zhejiang, Peoples R China
基金
中国国家自然科学基金;
关键词
radicle emergence; seed germination; seed quality; seed vigour; single counts; wheat; MEAN GERMINATION TIME; LOTS; MAIZE; SIZE; L;
D O I
10.15258/sst.2018.46.2.15
中图分类号
S3 [农学(农艺学)];
学科分类号
0901 ;
摘要
A study was carried out to investigate the use of single counts of radicle emergence to test seed vigour and predict seedling establishment of wheat (Triticum aestivum L.) seed lots. We compared the counts of radicle emergence at 20 degrees C for 36 and 48 hours, and at 13 degrees C for 66 and 72 hours with germination energy (GE), germination percentage (GP), germination index (GI), vigour index (VI), mean germination time (MGT), complex stressing vigour test (CSVT), relative of electrical conductivity (REC), accelerated aging test (AA) and field emergence (FE) using seven wheat seed lots. Radicle emergence counts after 36 and 48 hours at 20 degrees C and 66 and 72 hours at 13 degrees C correlated highly with four seed vigour parameters above (CSVT, REC, AA and FE), with correlation coefficients bigger than 0.75 (P < 0.05). The most significant correlation coefficients were obtained after 48 hours at 20 degrees C and 72 hours at 13 degrees C. Our results indicated that single counts of radicle emergence could be applied to test the wheat seed vigour. In addition, single counts of radicle emergence were proved to be a useful indicator of seedling emergence potential of wheat.
引用
收藏
页码:349 / 357
页数:9
相关论文
共 42 条
  • [1] Single counts of radicle emergence can be used as a fast method to test seed vigour of indica rice
    Luo, Y.
    Lin, C.
    Fu, Y. Y.
    Huang, Y. T.
    He, F.
    Guan, Y. J.
    Hu, J.
    SEED SCIENCE AND TECHNOLOGY, 2017, 45 (01) : 222 - 229
  • [2] Use of a single radicle emergence count as a vigour test in prediction of seedling emergence potential of leek seed lots
    Ermis, S.
    Karslioglu, M.
    Ozden, E.
    Demir, I.
    SEED SCIENCE AND TECHNOLOGY, 2015, 43 (02) : 308 - 312
  • [3] Single counts of radicle emergence provides an alternative method to test seed vigour in sweet corn
    Luo, Y.
    Guan, Y. J.
    Huang, Y. T.
    Li, J.
    Li, Z.
    Hu, J.
    SEED SCIENCE AND TECHNOLOGY, 2015, 43 (03) : 519 - 525
  • [4] Radicle emergence test for soybean vigour testing
    Gallo, Carina
    Magnano, Luciana
    SEED SCIENCE AND TECHNOLOGY, 2023, 51 (03) : 493 - 503
  • [5] Potential of a single radicle emergence count in predicting field emergence of Desi chickpea seed lots as an alternative vigour test
    Akbarpour, Maliheh
    Khajeh-Hosseini, Mohammad
    Seifi, Alireza
    SEED SCIENCE AND TECHNOLOGY, 2019, 47 (03) : 319 - 324
  • [6] Standardization of Radicle Emergence Test to Predict Seed Vigour and Field Emergence in Blackgram [Vigna mungo (L.) Hepper]
    Chinnasamy, G. P.
    Sundareswaran, S.
    Renganayaki, P. R.
    Vanitha, C.
    Srinivasan, S.
    LEGUME RESEARCH, 2025, 48 (03) : 450 - 455
  • [7] RADICLE EMERGENCE TEST STANDARDIZATION TO FORECAST FIELD EMERGENCE AND SEED VIGOUR IN HORDEUM VULGARE L.
    Mokhtari, Negar Ebrahim Pour
    COMPTES RENDUS DE L ACADEMIE BULGARE DES SCIENCES, 2023, 76 (09): : 1464 - 1472
  • [8] Use of seed vigour tests to predict seedling emergence of carrot
    Singh, Puneet K.
    Pandita, V. K.
    Tomar, B. S.
    Seth, Rakesh
    INDIAN JOURNAL OF HORTICULTURE, 2014, 71 (04) : 516 - 521
  • [9] Variety affects radicle emergence test results in wheat
    Summanen, Pauliina A. M.
    Laurila, Jaana
    SEED SCIENCE AND TECHNOLOGY, 2023, 51 (02) : 221 - 227
  • [10] Frequent individual counts of radicle emergence and mean just germination time predict seed vigour of Avena sativa and Elymus nutans
    Lv, Y. Y.
    Wang, Y. R.
    Powell, A. A.
    SEED SCIENCE AND TECHNOLOGY, 2016, 44 (01) : 189 - 198