Ion beam extracted from a 14GHz ECRIS of CAPRICE type

被引:0
|
作者
Spaedtke, P. [1 ]
Lang, R.
Maeder, J.
Rossbach, J.
Tinschert, K.
Stetson, J.
机构
[1] GSI Darmstadt, D-6100 Darmstadt, Germany
[2] MSU, NSCL, E Lansing, MI 48824 USA
来源
HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION | 2007年 / 31卷
关键词
ECRIS extraction; extraction simulation; beam profile;
D O I
暂无
中图分类号
O57 [原子核物理学、高能物理学];
学科分类号
070202 ;
摘要
An ion beam extracted from an ECRIS suffers from the inhomogeneous distribution of cold electrons within the minimum B configuration, necessary to confine the plasma. Especially for higher ion currents, the space charge force is not negligible any more, and because of the nonlinear force, emittance growth will occur. Measurements of the profile and the emittance of the beam directly behind the source show the complicated correlation between extraction voltage and plasma density. The emittance has been measured with a pepper pot device to account for the inhomogeneous azimuthal distribution of the beam. These results indicate that further information about the profile is required. To visualize the beam profile a tantalum foil with a thickness of 20 mu m has been used for an electrical beam power between 10 and 50W. Looking on the back side of the foil with a CCD camera it is possible to record the profile in real time. As a more sensitive diagnostic tool viewing targets made from BaF has been used. Three dimensional computer simulations have been used to identify the reason for the structures, observed in measurements.
引用
收藏
页码:192 / 195
页数:4
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