Measuring the feedback parameter of a semiconductor laser with external optical feedback

被引：57

作者：

Yu, Yanguang ^{[1
]}

Xi, Jiangtao ^{[1
]}

Chicharo, Joe F. ^{[1
]}

机构：

[1] Univ Wollongong, Sch Elect Comp & Telecommun Engn, Wollongong, NSW 2522, Australia

来源：

OPTICS EXPRESS | 2011年 / 19卷 / 10期

关键词：

LINEWIDTH-ENHANCEMENT FACTOR; SELF-MIXING INTERFEROMETRY; NOISE;

D O I：

10.1364/OE.19.009582

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Feedback parameter (the C factor) is an important parameter for a semiconductor laser operating in the regime of external optical feedback. Self-mixing interferometry (SMI) has been proposed for the measurement of the parameter, based on the time-domain analysis of the output power waveforms (called SMI signals) in presence of feedback. However, the existing approaches only work for a limited range of C, below about 3.5. This paper presents a new method to measure C based on analysis of the phase signal of SMI signals in the frequency domain. The proposed method covers a large range of C values, up to about 10. Simulations and experimental results are presented for verification of the proposed method. (C) 2011 Optical Society of America

引用

页码：9582 / 9593

页数：12

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