Recycling effect of germanium on ECR ion source

被引：2

作者：

Lehérissier, P ^{[1
]}

Barué, C ^{[1
]}

Canet, C ^{[1
]}

Dubois, M ^{[1
]}

Dupuis, M ^{[1
]}

Flambard, JL ^{[1
]}

Gaubert, G ^{[1
]}

Jardin, P ^{[1
]}

Lecesne, N ^{[1
]}

Lemagnen, F ^{[1
]}

Leroy, R ^{[1
]}

Pacquet, JY ^{[1
]}

机构：

[1] GANIL, Grp Prod Ions, F-14076 Caen 5, France

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2003年 / 211卷 / 02期

关键词：

D O I：

10.1016/S0168-583X(03)01213-8

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

After running for three weeks with a Ge-76 beam provided by the ECR-4 ion source at GANIL we have investigated the recycling effect of an SF6 plasma. The initial beam was produced by the classical method, using germanium dioxide in our micro-oven and helium as support gas. The overall ionization efficiency was measured and found to be around 3%. Without the oven, and using SF6 instead of helium, the ECR-4 ion source has been able to produce a very stable beam during a two-week period. The intensity of Ge-76(13+) (enrichment 88%) was increased to 40 e muA, and the overall ionization efficiency reached 40%. The oven method of production, the recycling effect and perspectives are described in this paper. (C) 2003 Elsevier B.V. All rights reserved.

引用

页码：274 / 280

页数：7

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