Testing of an Extended-Wavelength InGaAs Array in an Astronomical Spectrograph

被引:1
|
作者
Nelson, Matthew [1 ]
Yao, Lihong [1 ]
Wong, Andre F. [1 ]
Skrutskie, Michael [1 ]
Wilson, John C. [1 ]
Kanneganti, Srikrishna [1 ]
机构
[1] Univ Virginia, Dept Astron, Charlottesville, VA 22902 USA
关键词
InGaAs; NIR Arrays; Spectrograph; Integration Test;
D O I
10.1117/12.858003
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
We present the integration of a low dark current extended wavelength (2.3 mu m cutoff) InGaAs array into the Cornell-Massachusetts Slit Spectrograph (CorMASS) spectrograph. The InGaAs array was fabricated onto a SB-206 512x512 readout integrated circuit (ROIC) by Goodrich/Sensors Unlimited and subsequently went through a series of laboratory characterization tests at the University of Virginia demonstrating dark current performance of better than 10 e(-)/s. The InGaAs array is adapted for use with the CorMASS to verify its performance in a proven astronomical instrument, and for eventual deployment to a telescope to test stability and performance.
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页数:10
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