In-111;
Standardisation;
4 pi(LS)-gamma coincidence and anticoincidence;
Half-life measurements;
D O I:
10.1016/j.apradiso.2015.11.105
中图分类号:
O61 [无机化学];
学科分类号:
070301 ;
081704 ;
摘要:
The standardisation of In-111 by 4 pi(LS)-gamma coincidence and anticoincidence counting is presented. Absolute measurements were performed for samples with different concentrations of carrier solution and for different Window settings in the gamma channel. The radioactive concentration of the master solution determined on the same reference date was consistent for all measurements performed. The evaluated typical uncertainty was 0.43%. The half-life of In-111 was determined using a time series of measurements performed with an ionisation chamber. A least squares fit of the measured data resulted in a half-life of 2.8067 (34) days consistent with Decay Data Evaluation Project recommended value (0.064% higher than the DDEP value). (C) 2015 Elsevier Ltd. All rights reserved.