Active Q control in tuning-fork-based atomic force microscopy

被引:24
|
作者
Jahng, Junghoon
Lee, Manhee
Noh, Hanheol
Seo, Yongho
Jhe, Wonho [1 ]
机构
[1] Seoul Natl Univ, Dept Physiol & Anat, Seoul 151747, South Korea
[2] Sejong Univ, Inst Fundamental Phys, Dept Nanotechnol, Seoul, South Korea
关键词
CANTILEVERS; RESOLUTION;
D O I
10.1063/1.2753112
中图分类号
O59 [应用物理学];
学科分类号
摘要
The authors present comprehensive theoretical analysis and experimental realization of active Q control for the self-oscillating quartz tuning fork (TF). It is shown that the quality factor Q can be increased (decreased) by adding the signal of any phase lag, with respect to the drive signal, in the range of theta(1) to theta(1)+pi (theta(1)+pi to theta(1)+2 pi), where theta(1) is the characteristic constant of TF. Experimentally, the nominal Q value of 4.7x10(3) is decreased to 1.8x10(3) or increased to 5.0x10(4) in ambient condition, where the minimum detectable force is estimated to be 4.9x10(-14) N at 1 Hz. The novel Q control scheme demonstrated in the widely used quartz TF is expected to contribute much to scanning probe microscopy of, in particular, soft and biological materials. (C) 2007 American Institute of Physics.
引用
收藏
页数:3
相关论文
共 50 条
  • [21] Atomic resolution on Si(111)-(7x7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork
    Giessibl, FJ
    APPLIED PHYSICS LETTERS, 2000, 76 (11) : 1470 - 1472
  • [22] Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy
    Ooe, Hiroaki
    Sakuishi, Tatsuya
    Nogami, Makoto
    Tomitori, Masahiko
    Arai, Toyoko
    APPLIED PHYSICS LETTERS, 2014, 105 (04)
  • [23] Characterization of strongly coupled quartz tuning fork sensors for precision force measurement in atomic force microscopy
    Shaskey, Cedric
    Jarzembski, Amun
    Jue, Andrew
    Park, Keunhan
    ULTRAMICROSCOPY, 2024, 267
  • [24] Noncontact scanning force microscopy based on a modified tuning fork sensor
    Göttlich, H
    Stark, RW
    Pedarnig, JD
    Heckl, WM
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (08): : 3104 - 3107
  • [25] Three-dimensional force spectroscopy of KBr(001) by tuning fork-based cryogenic noncontact atomic force microscopy
    Such, Bartosz
    Glatzel, Thilo
    Kawai, Shigeki
    Koch, Sascha
    Meyer, Ernst
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2010, 28 (03):
  • [26] Noncontact friction force microscopy based on quartz tuning fork sensors
    Labardi, M.
    Allegrini, M.
    APPLIED PHYSICS LETTERS, 2006, 89 (17)
  • [27] Force-gradient-induced mechanical dissipation of quartz tuning fork force sensors used in atomic force microscopy
    Castellanos-Gomez, A.
    Agrait, N.
    Rubio-Bollinger, G.
    ULTRAMICROSCOPY, 2011, 111 (03) : 186 - 190
  • [28] A stabler non contact atomic force microscopy imaging using a tuning fork for air and liquid environments: The zero phase mode atomic force microscopy
    Van, L. Pham
    Kyrylyuk, V.
    Thoyer, F.
    Cousty, J.
    JOURNAL OF APPLIED PHYSICS, 2008, 104 (07)
  • [29] Quantitative atomic force measurement with a quartz tuning fork
    Lee, Manhee
    Jahng, Junghoon
    Kim, Kyungho
    Jhe, Wonho
    APPLIED PHYSICS LETTERS, 2007, 91 (02)
  • [30] Electrostatic force microscopy using a quartz tuning fork
    Seo, Y
    Jhe, WH
    Hwang, CS
    APPLIED PHYSICS LETTERS, 2002, 80 (23) : 4324 - 4326