Optimal Test Suite Generation for Modified Condition Decision Coverage Using SAT Solving

被引：5
|
作者：
Kitamura, Takashi [1 ]
Maissonneuve, Quentin [1 ,2 ]
Choi, Eun-Hye [1 ]
Artho, Cyrille [3 ]
Gargantini, Angelo [4 ]
机构：
[1] Natl Inst Adv Ind Sci & Technol, Osaka, Japan
[2] Univ Nantes, Nantes, France
[3] KTH Royal Inst Technol, Stockholm, Sweden
[4] Univ Bergamo, Bergamo, Italy
来源：
COMPUTER SAFETY, RELIABILITY, AND SECURITY (SAFECOMP 2018) | 2018年 / 11093卷
关键词：
REDUCTION;
D O I：
10.1007/978-3-319-99130-6_9
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
Boolean expressions occur frequently in descriptions of computer systems, but they tend to be complex and error-prone in complex systems. The modified condition decision coverage (MCDC) criterion in system testing is an important testing technique for Boolean expression, as its usage mandated by safety standards such as DO-178 [1] (avionics) and ISO26262 [2] (automotive). In this paper, we develop an algorithm to generate optimal MCDC test suites for Boolean expressions. Our algorithm is based on SAT solving and generates minimal MCDC test suites. Experiments on a real-world avionics system confirm that the technique can construct minimal MCDC test suites within reasonable times, and improves significantly upon prior techniques.
引用
收藏
页码：123 / 138
页数：16
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