High resolution speckle interferometry by replacing temporal information with spatial information

被引：0
|
作者：
Arai, Y. [1 ]
Inoue, T. [1 ]
Yokozeki, S. [2 ]
机构：
[1] Kansai Univ, 3-3-35 Yamate Cho, Osaka 5648680, Japan
[2] Jyouko Appl Opt Lab, Fukuoka 8114142, Japan
来源：
OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION VII | 2011年 / 8082卷
关键词：
ESPI; virtual speckle pattern; high resolution; high speed processing; FRINGE ANALYSIS; PHASE;
D O I：
10.1117/12.889224
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Electronic speckle pattern interferometry using virtual speckle patterns is a high resolution deformation measurement method. Usually, virtual speckle patterns have been produced by Hilbert transform or Carre algorithm. However, there are some problems concerning calculating time and quantity of deformation in the process of producing virtual speckle patterns. In proposed method, virtual speckle patterns are easily produced by replacing temporal information with spatial information on CCD without processing by Fourier transform or Carre algorithm. As the results, calculating cost of virtual speckle patterns is improved. It is confirmed that the new method is equal to ordinary methods in measurement accuracy.
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页数：8
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