High resolution speckle interferometry by replacing temporal information with spatial information

Electronic speckle pattern interferometry using virtual speckle patterns is a high resolution deformation measurement method. Usually, virtual speckle patterns have been produced by Hilbert transform or Carre algorithm. However, there are some problems concerning calculating time and quantity of deformation in the process of producing virtual speckle patterns. In proposed method, virtual speckle patterns are easily produced by replacing temporal information with spatial information on CCD without processing by Fourier transform or Carre algorithm. As the results, calculating cost of virtual speckle patterns is improved. It is confirmed that the new method is equal to ordinary methods in measurement accuracy.