Dielectric and electrical properties of sol-gel/DNA blends

被引：4

作者：

Norwood, R. A. ^{[1
]}

DeRose, C. T. ^{[1
]}

Himmelhuber, R. ^{[1
]}

Peyghambarian, N. ^{[1
]}

Wang, J. ^{[2
]}

Li, L. ^{[2
]}

Ouchen, F. ^{[3
]}

Grote, J. E. ^{[3
]}

机构：

[1] Univ Arizona, Coll Opt Sci, 1630 E Univ Blvd, Tucson, AZ 85721 USA

[2] TIPD LLC, Tucson, AZ USA

[3] US Air Force, Res Lab, Dayton, OH USA

来源：

NANOBIOSYSTEMS: PROCESSING, CHARACTERIZATION, AND APPLICATIONS II | 2009年 / 7403卷

基金：

美国国家科学基金会;

关键词：

sol-gel; DNA; capacitor; dielectric breakdown; energy storage; polymer blends;

D O I：

10.1117/12.830978

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

We investigate the dielectric and electrical properties of sol-gel/DNA-CTMA blends, with particular interest in capacitor applications in energy storage. Methacryloyloxypropyltrimethoxysilane (MAPTMS) was the sol-gel precursor, and DNA-CTMA was blended in to the resulting sol-gel at 5 weight%. The blend was then tested for its dielectric properties and dielectric breakdown strength; at frequencies below 10kHz the blend was found to have a dielectric constant in the range of 7.5, while the breakdown strength was greater than 800 V/mu m, an exceptional value. We discuss these results as well as other aspects of the dielectric and electrical properties of these blends.

引用

页数：11

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