Piezoresponse force microscopy studies of nanoscale domain structures in ferroelectric thin film

被引：12
|
作者：
Zeng, HR [1 ]
Yu, HF
Tang, XG
Chu, RQ
Li, GR
Yin, QR
机构：
[1] Chinese Acad Sci, Shanghai Inst Ceram, State Key Lab High Performance Ceram & Superfine, Shanghai 200050, Peoples R China
[2] Guangdong Univ Technol, Fac Appl Phys, Guangzhou 510090, Peoples R China
来源：
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 2005年 / 120卷 / 1-3期
关键词：
scanning force microscope; nanoscale domain; nanoscale displacement; ferroelectric thin film;
D O I：
10.1016/j.mseb.2005.02.021
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Piezoresponse force microscopy was used to perform studies of nanoscale domain imaging, limit of ferroelectric nano-sized grains and electric field-induced displacement behavior of domain structures in ferroelectric PZT thin film. Nanoscale 180 degrees and 90 degrees domain configurations as small as 30 nm in size were clearly visualized in the individual grains. It was demonstrated that domain configuration was strongly dependent on the size of the grains. The limit of ferroelectric nano-sized grains was found to be smaller than 25 nm. Nanoscale displacement versus field hysteresis loops were obtained in ferroelectric domains of PZT thin film, and discussed in terms of phenomenological theory. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码：104 / 108
页数：5
相关论文
共 50 条
  • [31] High-resolution piezoresponse force microscopy investigation of imprint in ferroelectric thin films
    Anbusathaiah, V.
    Nagarajan, V.
    Aggarwal, S.
    [J]. APPLIED PHYSICS LETTERS, 2006, 89 (13)
  • [32] Imaging and control of domain structures in ferroelectric thin films via scanning force microscopy
    Gruverman, A
    Auciello, O
    Tokumoto, H
    [J]. ANNUAL REVIEW OF MATERIALS SCIENCE, 1998, 28 : 101 - 123
  • [33] Switching spectroscopy piezoresponse force microscopy of ferroelectric materials
    Jesse, S
    Baddorf, AP
    Kalinin, SV
    [J]. APPLIED PHYSICS LETTERS, 2006, 88 (06)
  • [34] The effects of domain wall thickness on the nanoscale piezoresponse of ferroelectric domains
    Chen, L. Q.
    Pan, K.
    Liu, Y. Y.
    [J]. JOURNAL OF APPLIED PHYSICS, 2014, 116 (06)
  • [35] Scanning force microscopy: Application to nanoscale studies of ferroelectric domains
    Gruverman, A
    Auciello, O
    Tokumoto, H
    [J]. INTEGRATED FERROELECTRICS, 1998, 19 (1-4) : 49 - 83
  • [36] Identifying ferroelectric phase and domain structure using angle-resolved piezoresponse force microscopy
    Kim, K. L.
    Huber, J. E.
    [J]. APPLIED PHYSICS LETTERS, 2014, 104 (12)
  • [37] Piezoresponse Force Microscopy Study of Ferroelectric BaTiO3 Thin Film Directly Deposited on Si(001) by Magnetron Sputtering
    Lu, Hongliang
    Song, Shuangqi
    Gu, Xiaofeng
    He, Shuli
    Chen, Chonglin
    Song, Gangbing
    Cai, Zhonghou
    Guo, Haiming
    Gao, Hongjun
    Sun, Li
    [J]. JOURNAL OF NANO RESEARCH, 2013, 22 : 23 - 30
  • [38] Inhomogeneous domain nucleation and growth in disordered ferroelectric capacitors observed by modified piezoresponse force microscopy
    Kim, D. J.
    Jo, J. Y.
    Kim, Y. S.
    Song, T. K.
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2010, 43 (39)
  • [39] Asymmetric nanoscale switching in ferroelectric thin films by scanning force microscopy
    Gruverman, A
    Kholkin, A
    Kingon, A
    Tokumoto, H
    [J]. APPLIED PHYSICS LETTERS, 2001, 78 (18) : 2751 - 2753
  • [40] Crystallographic mapping of ferroelectric thin films using piezoresponse force microscopy and electron backscatter diffraction
    Lowe, Martin
    Hegarty, Tristan
    Mingard, Ken
    Li, Jian
    Cain, Markys
    [J]. EMAG: ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2007, 2008, 126
12345