An analytical circuit based nonlinear thermal model for capacitor banks

被引:11
|
作者
Wang, Haoran [1 ]
Wang, Huai [1 ]
机构
[1] Aalborg Univ, Ctr Reliable Power Elect CORPE, Aalborg, Denmark
关键词
Capacitor; Reliability; Thermal model; Lifetime;
D O I
10.1016/j.microrel.2018.06.112
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The thermal couplings among capacitors in a bank could significantly alter the reliability performance compared to a single capacitor. The impact of thermal coupling is becoming stronger for high power density systems due to more stringent constraint in volume. Prior-art studies take into account the thermal coupling effects of a capacitor bank by either Finite Element Method (FEM) or experimental characterization, which are case dependent and time-consuming. This paper proposes a nonlinear mathematical model for capacitor banks based on physics of thermal conduction, convection, and radiation. A simplified version of the model is also obtained and represented by an RC circuit network, which enables computational-efficient thermal stress modeling. The proposed models are convenient to use to support model based sizing of capacitor banks and is scalable for multi cell rectangle layout. A case study with experimental testing is discussed to verify the accuracy of the models.
引用
收藏
页码:524 / 527
页数:4
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