Concomitant wrinkling and buckle-delamination of elastic thin films on compliant substrates

被引:153
|
作者
Mei, Haixia [1 ]
Landis, Chad M. [1 ]
Huang, Rui [1 ]
机构
[1] Univ Texas Austin, Dept Aerosp Engn & Engn Mech, Austin, TX 78712 USA
基金
美国国家科学基金会;
关键词
Wrinkling; Buckling; Delamination; Thin film; Compliant substrate; VISCOUS LAYER; INSTABILITY; PATTERNS; SURFACE; MECHANICS; CRACKING; COMPRESSION; FRACTURE; POLYMER; STRAIN;
D O I
10.1016/j.mechmat.2011.08.003
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Compressing a thin elastic film attached to a thick compliant substrate can lead to buckling instability. Two commonly observed buckling modes, buckle-delamination and wrinkling, have each been analyzed separately in previous studies. Recent experiments have observed that the two modes can co-exist and co-evolve. In this paper, by analytical and finite element methods, we present a study on concomitant wrinkling and buckle-delamination for an elastic film on a highly compliant substrate. First, without delamination, we present an analytical solution for wrinkling that takes into account the effect of Poisson's ratio of the substrate. In comparison with a nonlinear finite element analysis, an approximate formula is derived to estimate the normal traction at the interface and to predict initiation of wrinkle-induced delamination. Next, with a pre-existing delamination crack, the critical strain for the onset of buckling instability is predicted by finite element eigenvalue analysis. For an intermediate delamination size, a mixed buckling mode is predicted with the critical compressive strain lower than previous solutions for both wrinkling and buckle-delamination. Post-buckling analyses show a significant shear-lag effect with an effective load transfer length three orders of magnitude greater than the film thickness. Finally, concomitant wrinkling and buckle-delamination is simulated to illustrate the interaction between the two buckling modes, and the results are discussed in view of failure mechanisms and applications in thin film metrology. (C) 2011 Elsevier Ltd. All rights reserved.
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页码:627 / 642
页数:16
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