Isotopic analysis of 28Si-Enriched silicon using laser mass spectrometry

被引：6
|
作者：
Kovalev, ID [1 ]
Malyshev, KN [1 ]
Potapov, AM [1 ]
Suchkov, AI [1 ]
机构：
[1] Russian Acad Sci, Inst High Pur Subst, Nizhnii Novgorod 603600, Russia
来源：
JOURNAL OF ANALYTICAL CHEMISTRY | 2001年 / 56卷 / 05期
基金：
俄罗斯基础研究基金会;
关键词：
Silicon; Analytical Chemistry; Mass Spectrometry; Enrichment Factor; Isotopic Analysis;
D O I：
10.1023/A:1016674919374
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
A procedure for the isotopic analysis of Si-28-enriched silicon by laser mass spectrometry is described. The procedure is based on the analysis of a dry concentrate or a film obtained by the pneumatic nebulization of an analyte and an internal standard solution or by the laser sputtering of a solid phase onto a support of a high-purity substance. The range of determinable isotope concentrations is (100-n x 10(-6)) at %; the total error in determining the major isotope is n x 10(-2) at % at an enrichment factor higher than 99%. The procedure provides the simultaneous control of 70 impurity elements in the sample.
引用
收藏
页码：437 / 442
页数：6
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