Stability Analysis of W-Band Extended Interaction Output Cavity

被引：0
|
作者：
Zhong, Yong [1 ]
Wang, Yong [1 ]
机构：
[1] Chinese Acad Sci, Inst Elect, Key Lab High Power Microwave Sources & Technol, Beijing 100190, Peoples R China
来源：
IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE | 2014年
关键词：
w-band; extended; interaction; output cavity;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, a novel w-band extended interaction output cavity stability analysis is presented. Adopting beam quality factor and PIC code, stability analysis of the eight ladder grids cavity is discussed for the 2 pi operation mode. Results show that reasonable beam quality factor can reach more stable output power without oscillation of parasitic mode.
引用
收藏
页码：343 / 344
页数：2
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