Polycrystalline metal surfaces studied by X-ray photoelectron spectro-microscopy

被引：0

作者：

Potts, AW ^{[1
]}

Morrison, GR ^{[1
]}

Khan, SR ^{[1
]}

Gregoratti, L ^{[1
]}

Kiskinova, M ^{[1
]}

机构：

[1] Univ London Kings Coll, Dept Phys, London WC2R 2LS, England

来源：

X-RAY MICROSCOPY, PROCEEDINGS | 2000年 / 507卷

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The scanning photoelectron microscope (SPEM) on beam line 2.2 at the Elettra synchrotron produces small spot XPS spectra front a sub-micron radiation microprobe. It is also capable of producing surface images in terms of the energy resolved photoelectron signal. This microscope has been used to study oxidation on polycrystalline tin and lead surfaces and the variations in reactivity between different crystallite surfaces. The diffusion of gold and silver films on polycrystalline metal surfaces has also been followed.

引用

页码：269 / 273

页数：5

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