Automating PCB functional test

被引：0
|
作者：
Kennedy, M [1 ]
Burroughs, G
Bailey, EF
机构：
[1] Bloomy Controls, Milford, MA 01757 USA
[2] Bloomy Controls, Windsor, CT 06095 USA
[3] Lifeline Syst, Framingham, MA 01702 USA
来源：
EE-EVALUATION ENGINEERING | 2003年 / 42卷 / 07期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
An experienced systems integrator shares some practical approaches to developing fast and effective test systems.
引用
收藏
页码：32 / +
页数：5
相关论文
共 50 条
  • [31] Automating lattice perturbation theory in the Schrodinger functional
    Ribeca, P
    NUCLEAR PHYSICS B-PROCEEDINGS SUPPLEMENTS, 2005, 140 : 731 - 733
  • [32] Assembled PCB EMC test methods
    Coenen, Mart
    Gierstberg, Tom
    van Roermund, Arthur
    2012 ASIA-PACIFIC INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (APEMC), 2012, : 493 - 496
  • [33] Systems and software support PCB test
    Nelson, R., 1600, Nelson Publishing Inc. (52):
  • [34] Accepting the PCB test and inspection challenge
    Sexton, John
    SMT Surface Mount Technology Magazine, 2001, 15 (04): : 108 - 109
  • [35] Fully automatic PCB test fixturing
    De Maertelaere, Lut
    Guthrie, Thomas L.
    Printed Circuit Fabrication, 1998, 21 (03):
  • [36] Test & measurement. PCB testing
    Pepin, Colin
    Pulse Electronics in Southern Africa, 1993,
  • [37] Using VNA to Test the PCB Impedence
    Liu, Dan
    Li, Shubiao
    Yuan, Guoping
    2017 17TH IEEE INTERNATIONAL CONFERENCE ON COMMUNICATION TECHNOLOGY (ICCT 2017), 2017, : 997 - 1001
  • [38] Reliability prediction and PCB test coupons
    Neale, Ron
    Electronic Engineering (London), 2002, 74 (902): : 33 - 34
  • [39] Reliability prediction and PCB test coupons
    Neale, R
    ELECTRONIC ENGINEERING DESIGN, 2002, 74 (902): : 33 - 34
  • [40] The research of PCB functional testing instrument
    Kun, LY
    Yong, ZL
    Sun-Chao
    Jiu, LS
    ISTM/2005: 6th International Symposium on Test and Measurement, Vols 1-9, Conference Proceedings, 2005, : 1670 - 1673
12345