Transition Test Bring-Up and Diagnosis on UltraSPARC™ Processors

被引：0

作者：

Chen, Liang-Chi ^{[1
]}

Dahlgren, Peter ^{[1
]}

Dickinson, Paul ^{[1
]}

Davidson, Scott ^{[1
]}

机构：

[1] Oracle Corp, Santa Clara, CA 95054 USA

来源：

2011 IEEE INTERNATIONAL TEST CONFERENCE (ITC) | 2011年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We describe methods to use PLL-based transition test in support of chip bring-up. We used it to diagnose slow paths for performance improvement. During bring-up, often the issues of setup, design, scan patterns, and silicon slow paths are mixed together, making diagnosis more difficult. We discuss techniques used to understand and resolve these issues, and show examples of the benefit of transition test over functional and system test.

引用

页数：10

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