Orthogonal electron impact source for a time-of-flight mass spectrometer with high mass resolving power

被引：13
|
作者：
Chen, YH
Gonin, M
Fuhrer, K
Dodonov, A
Su, CS
Wollnik, H
机构：
[1] Univ Giessen, Inst Phys 2, D-35392 Giessen, Germany
[2] Natl Tsing Hua Univ, Dept Nucl Sci, Hsinchu, Taiwan
[3] Russian Acad Sci, Inst Phys Chem, Chernogolovka, Russia
来源：
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY | 1999年 / 185卷
关键词：
time-of-flight mass spectrometer; ion source; electron impact;
D O I：
10.1016/S1387-3806(98)14152-0
中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
A compact orthogonal ion source has been developed for the gas analysis in time-of-flight mass spectrometers with the goal to use such a system for the investigation of cometary gases. An extraordinary mass resolving power of m/Delta m greater than or equal to 10 000 and low detection limits have been obtained in a 1.3 m long instrument. (Int J Mass Spectrom 185/186/187 (1999) 221-226) (C) 1999 Elsevier Science B.V.
引用
收藏
页码：221 / 226
页数：6
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