Modeling of Self-Heating Effect for Depletion-Type Si Micro-Ring Modulator

被引：0
|
作者：
Ban, Yoojin [1 ]
Yu, Byung-Min [1 ]
Rhim, Jinsoo [1 ]
Lee, Jeong-Min [1 ]
Choi, Woo-Young [1 ]
机构：
[1] Yonsei Univ, Dept Elect & Elect Engn, Seoul, South Korea
来源：
2015 IEEE OPTICAL INTERCONNECTS CONFERENCE | 2015年
关键词：
OPTICAL BISTABILITY; SILICON;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We present an accurate model for self -heating effect in depletion-type Si micro-ring modulator which describes incident-power dependent transmission and dynamics. Its accuracy is confirmed with measurement. It can be useful for determining optimal modulation conditions,
引用
收藏
页码：134 / 135
页数：2
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