Accelerometer Transverse Sensitivity Testing with Double Turntable Centrifuge

被引：0
|
作者：
Guan, Wei [1 ]
Meng, Xiaofeng [1 ]
Dong, Xueming [2 ]
机构：
[1] Beijing Univ Aeronaut & Astronaut, Sci & Technol Inertial Lab, Beijing 100191, Peoples R China
[2] Changcheng Inst Metrol & Measurement, Beijing 100095, Peoples R China
来源：
2014 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) PROCEEDINGS | 2014年
关键词：
accelerometer; calibration; centrifuge; transverse sensitivity; low frequency;
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
An approach suitable for calibrating the transverse sensitivity of accelerometer at low-frequency is presented in this work. The method proposed here employs the double turntable centrifuge as the apparatus to provide standard reference accelerations. Numerical simulation and experimental investigation are done to validate the method. Testing results of a single-axis inertial accelerometer are consistent with the simulation. Typical '8' figure of the accelerometer transverse sensitivity is obtained. Both the simulation and experiment results show that the testing of the accelerometer transverse sensitivity of with the double turntable centrifuge is practicable..
引用
收藏
页码：578 / 582
页数：5
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