Use DSOs to catch elusive bugs in high-speed digital electronics

被引：0
|
作者：
Lauricella, F [1 ]
机构：
[1] LeCroy Corp, Test & Measurement Div, Value Oscilloscope Grp, Chestnut Ridge, NY 10977 USA
来源：
ELECTRONIC DESIGN | 1998年 / 46卷 / 15期
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：121 / +
页数：4
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