Overview of wire bonding using copper wire or insulated wire

被引:81
|
作者
Zhong, Z. W. [1 ]
机构
[1] Nanyang Technol Univ, Sch Mech & Aerosp Engn, Singapore 639798, Singapore
关键词
JOINT RELIABILITY-ANALYSIS; FLAME-OFF CHARACTERISTICS; FINITE-ELEMENT-ANALYSIS; TAIL BREAKING FORCE; HEAT-AFFECTED ZONE; FLIP-CHIP; PROCESS PARAMETERS; BALL BONDS; SOLDER; AU;
D O I
10.1016/j.microrel.2010.06.003
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Wire bonding using copper or insulated wire leads to many advantages and new challenges. Research is intensively performed worldwide, leading to many new findings and solutions. This article reviews recent advances in wire bonding using copper wire or insulated wire for advanced microelectronics packaging. Journal articles, conference articles and patents published or issued recently are reviewed. The benefits and problems/challenges related to wire bonding using copper wire or insulated wire such as wire open and short tail defects, poor bondability for stitch/wedge bonds, oxidation of Cu wire, and stiff wire on weak support structures, are briefly analyzed. A number of solutions to the problems and recent findings/developments related to wire bonding using copper wire or insulated wire are discussed. With the references provided, readers may explore more deeply by reading the original articles and patent documents. (C) 2010 Elsevier Ltd. All rights reserved.
引用
收藏
页码:4 / 12
页数:9
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